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    Tan Binghe, Cui Xinfa. On the Relation of three Correction Models in Fluorescent X-Ray Analysis of Steel[J]. Chinese Journal of Engineering, 1988, 10(4): 481-486. doi: 10.13374/j.issn1001-053x.1988.04.034
    Citation: Tan Binghe, Cui Xinfa. On the Relation of three Correction Models in Fluorescent X-Ray Analysis of Steel[J]. Chinese Journal of Engineering, 1988, 10(4): 481-486. doi: 10.13374/j.issn1001-053x.1988.04.034

    On the Relation of three Correction Models in Fluorescent X-Ray Analysis of Steel

    doi: 10.13374/j.issn1001-053x.1988.04.034
    • Received Date: 1987-01-20
      Available Online: 2021-11-15
    • In fluorescent X-ray analysis of Steel sample, matrix effect must be corrected using Lachance, De Jongh and JIS models. This three correction factors exit definite relation. Lachance model's α and De Jongh model's α may exchange each other. The αB used in Lachance α and De Jongh models may transfer into d's used in JIS model. The value of Ei computed from theoretical correction factor αi. used in Lachance model is same as found from calibrate curve, and the correction factors d* used in De Jongh and JIS models covered from Lanchance mondel, αB is same as computed directly by individual ternary sample method.

       

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