Angle-resolved XPS Studies of Magnetic Multilayers Ta/NiO/NiFe/Ta

YU Guanghua; ZHU Fengwu; MA Jidong; WANG Anrong

doi:10.13374/j.issn1001-053x.2002.02.024

Volume 24 Issue 2

Aug. 2021

Turn off MathJax

Article Contents

Article Navigation > Chinese Journal of Engineering > 2002 > 24(2): 191-193

YU Guanghua, ZHU Fengwu, MA Jidong, WANG Anrong. Angle-resolved XPS Studies of Magnetic Multilayers Ta/NiO/NiFe/Ta[J]. Chinese Journal of Engineering, 2002, 24(2): 191-193. doi: 10.13374/j.issn1001-053x.2002.02.024

Citation:

YU Guanghua, ZHU Fengwu, MA Jidong, WANG Anrong. Angle-resolved XPS Studies of Magnetic Multilayers Ta/NiO/NiFe/Ta[J]. Chinese Journal of Engineering, 2002, 24(2): 191-193. doi: 10.13374/j.issn1001-053x.2002.02.024

Citation:

PDF( 396 KB)

Angle-resolved XPS Studies of Magnetic Multilayers Ta/NiO/NiFe/Ta

doi: 10.13374/j.issn1001-053x.2002.02.024

Materials Science and Engineering School, UST Beijing, Beijing 100083, China

Received Date: 2001-12-31
Available Online: 2021-08-21

Abstract

Abstract

Ta/NiO/NiFe/Ta multilayers were prepared by magnetron sputtering. The composition and chemical states at the interface region of NiO/NiFe were studied using the angle-resolved X-ray photoelectron spectroscopy (XPS). The results show that there are two thermodynamically favorable reactions at NiO/NiFe interface: NiO+Fe = Ni+FeO and 3NiO+2Fe =3 Ni+Fe₂O₃ The thickness of the chemical reaction as estimated by angle-resolved XPS was about 1-1.5 nm. These interface reaction products are magnetic defects, and- the exchange coupling field H_ex and the coercivity H_c of NiO/NiFe are affected by these defects.
- angle-resolved XPS,
- NiO/NiFe,
- exchange coupling,
- interface reaction