New Nondestructive Testing Equipment by Fixed Probe Based onthe Contact Potential Difference Method

Wu Bingzhen; Wang Junran; Ling Muzhao

doi:10.13374/j.issn1001-053x.1998.02.038

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Wu Bingzhen, Wang Junran, Ling Muzhao. New Nondestructive Testing Equipment by Fixed Probe Based onthe Contact Potential Difference Method[J]. Chinese Journal of Engineering, 1998, 20(2): 164-168. doi: 10.13374/j.issn1001-053x.1998.02.038

Citation:

Wu Bingzhen, Wang Junran, Ling Muzhao. New Nondestructive Testing Equipment by Fixed Probe Based onthe Contact Potential Difference Method[J]. Chinese Journal of Engineering, 1998, 20(2): 164-168. doi: 10.13374/j.issn1001-053x.1998.02.038

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New Nondestructive Testing Equipment by Fixed Probe Based onthe Contact Potential Difference Method

doi: 10.13374/j.issn1001-053x.1998.02.038

1. Information Engineering School, UST Beijing, Beijing 100083, China;
2. Kanagawa University Japan

Received Date: 1997-07-25
Available Online: 2021-08-27

Abstract

Abstract

The structure, working principle, measuring circuit and frequency characteristics of contact potential difference nondestructive testing equipment using fixed probe am intro-duced. It is demonstrated by the experimental result that this equipment is effective for testing the local narrow dynamic endurance failure on the surface of metal.
- contact potential difference method,
- fixed probe,
- nondestructive testing