Self-Learning Pattern Recognition Method Base on the Statistical Space Mapping

XU Zhengguang; QU Shoude; YU Lianrong

doi:10.13374/j.issn1001-053x.2003.05.050

Volume 25 Issue 5

Aug. 2021

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Article Navigation > Chinese Journal of Engineering > 2003 > 25(5): 480-482

XU Zhengguang, QU Shoude, YU Lianrong. Self-Learning Pattern Recognition Method Base on the Statistical Space Mapping[J]. Chinese Journal of Engineering, 2003, 25(5): 480-482. doi: 10.13374/j.issn1001-053x.2003.05.050

Citation:

XU Zhengguang, QU Shoude, YU Lianrong. Self-Learning Pattern Recognition Method Base on the Statistical Space Mapping[J]. Chinese Journal of Engineering, 2003, 25(5): 480-482. doi: 10.13374/j.issn1001-053x.2003.05.050

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Self-Learning Pattern Recognition Method Base on the Statistical Space Mapping

doi: 10.13374/j.issn1001-053x.2003.05.050

1. Information Engineering School, University of Science and Technology Beijing, Beijing 100083, China;
2. Industry School of Henan Province, Zhengzhou 450002, China

Received Date: 2002-11-22
Available Online: 2021-08-17

Abstract

Abstract

Base on the statistical space mapping a self-learning method was proposed, which can overcome the shortcoming that the measured work-state data can not cover all the data space. Simulating experiment at results for the measured work-state data show its availability.
- self-learning,
- pattern recognition,
- statistical